TP200B probe with standard force module

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$4,620.24

The TP200 and TP200B are electronic probes using strain gage technology which gives higher accuracy than kinematic touch-trigger probes. They combine outstanding metrology performance with superior functionality to produce a highly versatile DCC CMM probing system with excellent productivity.

SKU: A-1207-0055 Categories: ,

The TP200 system components are:
• TP200 probe body – the standard model
• TP200B probe body – a variant model with increased vibration tolerance
• TP200 stylus module – choice of fixed overtravel forces: ‘SF’ (standard force) or ‘LF’ (low force)
• PI 200 probe interface
• SCR200 stylus changing rack

TP200 probe body
The TP200 probe incorporates micro strain gage transducers delivering excellent repeatability and accurate 3D form measurement even with long styli. The sensor technology gives sub-micron triggering performance and eliminates the lobing characteristics encountered with standard probes. The solid state ASIC electronics within the probe ensure reliable operation over millions of trigger points.

TP200B probe body
The TP200B probe uses the same technology as TP200 but has been designed to have a higher tolerance to vibration. This helps to overcome the problem of ‘air’ trigger generation which can arise from vibrations transmitted through the CMM or when using longer styli with faster positioning speeds. Please note that we do not recommend the use of TP200B with the LF module or cranked/star styli.

Specification

TP200 TP200B
Principal application DCC CMM where high accuracy is required As TP200 but where ‘air trigger’* events occur
Sense directions 6-axis: ±X, ±Y, ±Z 6-axis: ±X, ±Y, ±Z
Unidirectional repeatability (2σ µm)
Trigger level 1 0.4 µm (0.000016 in) 0.4 µm (0.000016 in)
Trigger level 2 0.5 µm (0.00002 in) 0.5 µm (0.00002 in)
XY (2D) form measurement deviation
Trigger level 1 ±0.8 µm (0.000032 in) ±1 µm (0.00004 in)
Trigger level 2 ±0.9 µm (0.000036 in) ±1.2 µm (0.000047 in)
XYZ (3D) form measurement deviation
Trigger level 1 ±1 µm (0.00004 in) ±2.5 µm (0.0001 in)
Trigger level 2 ±1.40 µm (0.000056 in) ±4 µm (0.00016 in)
Repeatability of stylus change
With SCR200 ±0.50 µm (0.00002 in) max ±0.50 µm (0.00002 in) max
Manual ±1 µm (0.00004 in) max ±1 µm (0.00004 in) max
Trigger force (at stylus tip)
XY plane – all modules 0.02 N 0.02 N
Z axis – all modules 0.07 N 0.07 N
Overtravel force (@ 0.5 mm displacement)
XY plane – SF / EO module 0.2 N to 0.4 N 0.2 N to 0.4 N
XY plane -LF module 0.1 N to 0.15 N 0.1 N to 0.15 N
Z-axis – SF / EO module 4.90 N 4.90 N
Z-axis -LF module 1.60 N 1.60 N
Weight (probe sensor and module) 22 g (0.78 oz) 22 g (0.78 oz)
Maximum extension (if on PH10 series head) 300 mm (11.81 in) 300 mm (11.81 in)
Maximum recommended stylus length (M2 styli range)
SF / EO module 50 mm (1.97 in) steel to 100 mm (3.94 in) GF 50 mm (1.97 in) steel to 100 mm (3.94 in) GF
LF module 20 mm (0.79 in) steel to 50 mm (1.97 in) GF 20 mm (0.79 in) steel to 50 mm (1.97 in) GF
Mounting method M8 thread M8 thread
Suitable interface PI 200-3, UCC2-2 PI 200-3, UCC2-2
Stylus module changing rack
Automatic SCR200 SCR200
Manual MSR1 MSR1

Above data applies for test conditions as follows: Stylus length 50 mm (1.97 in), stylus velocity 480 mm/min (1.57 ft/min)
* Air trigger (or false trigger). The TP200B reduces probe triggers that may be caused by vibrations.

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Additional information

Weight 2 lbs
Dimensions 10 × 8 × 6 in

Quick Comparison

SettingsTP200B probe with standard force module removeDatum sphere fixing studs M8 × 1.25 removeDatum sphere fixing studs 5/16–18 UNC removeDatum sphere fixing studs M10 × 1.5 removePH10M-iQ PLUS removeØ12 mm datum ball remove
ImageRenishaw, TP200 probe with standard force module, A-1207-0001Renishaw, Datum sphere fixing studs M6 × 1, A-1034-0352Renishaw, Datum sphere fixing studs M6 × 1, A-1034-0352Renishaw, Datum sphere fixing studs M6 × 1, A-1034-0352Renishaw, PH10M-iQ PLUS, A-5863-7000Renishaw, Ø12 mm datum ball, A-1034-0005
SKUA-1207-0055A-1034-0351A-1034-0354A-1034-0350A-5863-7000A-1034-0005
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DescriptionThe TP200 and TP200B are electronic probes using strain gage technology which gives higher accuracy than kinematic touch-trigger probes. They combine outstanding metrology performance with superior functionality to produce a highly versatile DCC CMM probing system with excellent productivity.A fixing stud is required with each kit to attach the pillar to the table surface. Select one from the list below.A fixing stud is required with each kit to attach the pillar to the table surface. Select one from the list below.A fixing stud is required with each kit to attach the pillar to the table surface. Select one from the list below.PH10M-iQ PLUS functions identically to a traditional PH10M PLUS but with the addition of inferred qualification technology. Inferred qualification increases throughput by removing the need to qualify each head position that is used in a measurement program. PH10M-iQ PLUS works with all PH10M compatible probes, but only touch-trigger probe configurations can utilize inferred qualification. Scanning probes can be used in traditional PH10M qualification mode but cannot use inferred qualification.
Weight211131
Dimensions10 × 8 × 6 in6 × 6 × 6 in6 × 6 × 6 in6 × 6 × 6 in10 × 8 × 5 in6 × 6 × 6 in
Additional information
Weight 2 lbs
Dimensions 10 × 8 × 6 in
Weight 1 lbs
Dimensions 6 × 6 × 6 in
Weight 1 lbs
Dimensions 6 × 6 × 6 in
Weight 1 lbs
Dimensions 6 × 6 × 6 in
Weight 3 lbs
Dimensions 10 × 8 × 5 in
Weight 1 lbs
Dimensions 6 × 6 × 6 in
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